LOINC
Version 2.66

660-1Microscopic observation [Identifier] in Unspecified specimen by Dark field examinationActive

Component
Microscopic observation
Property
Prid
Time
Pt
System
XXX
Scale
Nom
Method
Dark field examination

Additional Names

Short Name
Dark Field XXX
Display Name Beta
Microscopic observation Dark field examination Nom (Unsp spec)
Consumer Name Alpha
Microscopic Observation, Unspecified Specimen

Part Description

LP40224-5   Microscopic observation
Microscopy is a technique that uses microscopes to examine very small objects, not seen by the naked eye. There are three well-known branches of microscopy: optical, electron and scanning probe microscopy. Copyright Text is available under the Creative Commons Attribution/Share-Alike License. See http://creativecommons.org/licenses/by-sa/3.0/ for details. Source: Wikipedia, Microscopy

Basic Attributes

Class
MICRO
Type
Laboratory
First Released
Version 1.0
Last Updated
Version 1.0ma
Order vs. Observation
Both

Member of these Panels

LOINC Long Common Name
54037-7 HEDIS 2009 panel
57820-3 HEDIS 2010 panel
60442-1 HEDIS 2011 panel
67767-4 HEDIS 2012 panel
72199-3 HEDIS 2013 panel
74234-6 HEDIS 2014 Value Sets

Language Variants Get Info

zh-CNChinese (China)
显微镜观察:存在与否或特征标识:时间点:XXX:名义型:暗视野显微镜检查
nl-NLDutch (Netherlands)
microscopische waarneming:identificator:moment:XXX:nominaal:donkerveldonderzoek
fr-BEFrench (Belgium)
Observation microscopique:Présence ou identité:Temps ponctuel:XXX:Nominal:Examen sur fond noir
fr-CAFrench (Canada)
Observation microscopique:Présence ou identité:Temps ponctuel:XXX:Nominal:Examen sur fond noir
fr-FRFrench (France)
Microscopic observation:Prid:Pt:XXX:Nom:Dark field examination
it-ITItalian (Italy)
Osservazione microscopica:Prid:Pt:XXX:Nom:Esame in campo oscuro
ko-KRKorean (Korea, Republic of)
현미경적 관찰:존재:검사시점:XXX:명칭결과:암시야현미경 검사
pt-BRPortuguese (Brazil)
Observação microscópica :Ident:Pt:XXX:Nom:Campo escuro
es-ARSpanish (Argentina)
observación microscópica:presencia o identidad:punto en el tiempo:XXX:Nominal:examen sobre campo oscuro
es-ESSpanish (Spain)
Observación microscópica:Presencia o identidad:Punto temporal:XXX:Nom:Examen en campo oscuro
tr-TRTurkish (Turkey)
Mikroskopik inceleme:MevcKimlik:Zmlı:XXX:Snf:Karanlık alan inceleme

LOINC FHIR® API Example - CodeSystem Request Get Info

https://fhir.loinc.org/CodeSystem/$lookup?system=http://loinc.org&code=660-1